doc. no : qw0905-LURF3933S-PF rev. : a date : 17 - oct. - 2006 data sheet LURF3933S-PF super bright round type led lamps ligitek electronics co.,ltd. property of ligitek only lead-free parts pb
9.0 11.0 directivity radiation note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. 30 -30 100% 100%75%50%25% 50% 025% 75% -60 60 2.54typ 0 + - 25.0min 1.0min 0.5 typ 1.5max package dimensions part no. LURF3933S-PF ligitek electronics co.,ltd. property of ligitek only 9.1 8.0 page 1/5
note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. typical electrical & optical characteristics (ta=25 ) algainp material LURF3933S-PF part no red water clear color emitted lens spectral halfwidth nm forward voltage @20ma(v) viewing angle 2 1/2 (deg) luminous intensity @20ma(mcd) dominant wave length dnm 2.6 1.7 20 625 max. 950020 6200 typ. min. t opr operating temperature storage temperature tstg peak forward current duty 1/10@10khz reverse current @5v power dissipation forward current ir pd i fp i f -40 ~ +85 -40 ~ +100 10 120 90 50 a mw ma ma absolute maximum ratings at ta=25 parameter symbol page 2/5 ratings urf(s) unit ligitek electronics co.,ltd. property of ligitek only min. static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. * electrostatic discharge( * ) esd2000v part no. LURF3933S-PF
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 fig.4 luminous intensity vs. temperature ambient temperature( ) l u m i n o u s i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage f o r w a r d c u r r e n t ( m a ) forward current(ma) l u m i n o u s i n t e n s i t y n o r m a l i z e @ 2 0 m a ligitek electronics co.,ltd. property of ligitek only 0 0 50 100 150 050100150 0.0 1.0 2.0 3.0 -40-200204060 0.51.01.52.0 80100 0.94 -20 -4040 20 080100 60 0.8 0.0 0.2 0.4 0.6 1.0 1.2 urfs chip page 3/5 fig.2 luminous intensity vs. forward current 5.0 4.0 6.0 2.53.0 0.96 0.98 1.00 1.02 1.04 1.06 0 550600650700 0.5 1.0 part no. LURF3933S-PF
note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. time(sec) 0 preheat 0 50 25 120 2 /sec max 100 260 temp( c) 260 c3sec max 5 /sec max 150 dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) 2.wave soldering profile ligitek electronics co.,ltd. property of ligitek only page 4/5 60 seconds max part no. LURF3933S-PF
test condition 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) 1.t.sol=260 5 2.dwell time= 10 1sec. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles solder resistance test solderability test 1.t.sol=230 5 2.dwell time=5 1sec operating life test thermal shock test high temperature high humidity test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs low temperature storage test high temperature storage test reliability test: test item mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. the purpose of this test is the resistance of the device under tropical for hours. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 description reference standard ligitek electronics co.,ltd. property of ligitek only page 5/5 part no. LURF3933S-PF
|
